Accelerating Graphene Research: Bruker AFMs enable advanced graphene property measurements.
Atomic Force Microscopy is ideal technique to non-destructively characterize graphene and the high performance materials and devices that exploit its unique properties. Bruker innovations are now fueling study of graphene, such as linear dispersion (massless electrons), electron mobility and minimum conductivity.
Bruker’s latest PeakForce Tapping™ innovations will now deliver critical insights into the mechanical, electrical and defect properties of graphene.
- PeakForce QNM® modulus, deformation, adhesion
- PeakForce KPFMTM quantitative work function
- PeakForce TUNATM current mapping of devices
Besides Bruker, as AFM market leader, provides leading AFM systems and probes enabling researchers to extend the boundaries of nanoscale science. Our integrated AFM-Raman systems enable correlated AFM-Raman studies and Tip-Enhanced Raman Spectroscopy (TERS). AFM and Raman spectroscopy provide highly complementary information. Where AFM excels at providing highest resolution surface structure and nanomechanical and –electrical property information, the vibrational spectroscopic signature revealed in a Raman spectrum can identify chemistry and crystallography or graphene electronic structure in a manner that is both, label-free and nondestructive. Beyond the benefits of complementarity, the combination of AFM and Raman spectroscopy can facilitate tip-enhanced Raman spectroscopy (TERS), bringing Raman spatial resolution into the nanoscale.
For further information, do not hesitate to contact us at email@example.com or visit our website www.bruker.com/graphene